سال انتشار: ۱۳۸۵

محل انتشار: دوازدهمین کنفرانس سالانه انجمن کامپیوتر ایران

تعداد صفحات: ۴

نویسنده(ها):

Mirzaaghatabar – Sharif University of Technology, Tehran, Iran
Hessabi – Sharif University of Technology, Tehran, Iran
Pedram – Amirkabir University of Technology, Tehran, Iran

چکیده:

Lack of global clock for synchronization in asynchronous circuits decreases the controllability of these circuits and thus makes asynchronous circuits hard to test. Delay Insensitive (DI) circuits exclusively use C-elements and inverters, provided that only single output gates are used. In this paper we present a new method to conceptually change this class of asynchronous circuits. The main idea is to change C-elements into other elements which can be modeled by synchronous tools. Then we use HOPE, a synchronous sequential circuits fault simulator, and apply it to DI class of asynchronous circuits. The stuck-at model is used for fault simulation. Our observations show that we can achieve considerable fault coverage, mainly 92.5%, in DI circuits by this method. To the best of our knowledge, this is the first effort in using synchronous tool to achieve fault simulation for asynchronous circuit class.