سال انتشار: ۱۳۸۶
محل انتشار: سومین کنفرانس بین المللی فناوری اطلاعات و دانش
تعداد صفحات: ۱۳
Tajeripour – Department of Electrical Engineering, Tarbiat Modarres University, Tehran, Iran.
Sheikhi – Department of Electrical and Electronics Engineering, Shiraz University, Shiraz, Iran.
Kabir – Department of Electrical Engineering, Tarbiat Modarres University, Tehran, Iran.
Local Binary Patterns, LBP, is one of the features which has been used for texture classification. In this paper, a method based on using these features is proposed for defect detection in patterned fabrics. In the training stage, at first step LBP operator is applied to an image of defect free fabric, pixel by pixel, and the reference feature vector is computed.Then this image is divided into windows and LBP operator is applied to each of these windows. Based on comparison with the reference feature vector a suitable threshold for defect free windows is found. In the detection stage, a test image is divided into windows and using the threshold, defective windows can be detected. The proposed method is multi resolution and gray scale invariant. Because of its simplicity, online implementation is possible as well.