سال انتشار: ۱۳۸۷
محل انتشار: دومین کنگره بین المللی علوم و فناوری نانو
تعداد صفحات: ۲
R Niaraki Asli – Department of Electrical Engineering, Faculty of Engineering, University of Guilan P. O. Box: 3756
The silicon-scaling revolution is quite real and persistent. The bizarre vagaries of nanoscale technologies put a heavy burden on the test community, as scaling beyond 45 nanometers greatly extends process complexity and exacerbates leakage faults and soft errors. So, a test engineer faces serious test accessibility problems.This paper presents test access problems in nanoscale designs and introduces the future tendencies in this area. The sequel of this paper is as follows: The nanoscale design and test requirements have been introduced, then, test accessibility problems and the future trends in nanoscale designs have been presented. The paper is concluded in the final section.